[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - Power integrity optimization on USB power distribution network for EMI reduction
Hung, Kuo-Chiang, Chen, TimYear:
2014
Language:
english
DOI:
10.1109/VLSI-DAT.2014.6834919
File:
PDF, 2.70 MB
english, 2014