[IEEE IEEE International Conference on Test, 2005. -...

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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Low-capture-power test generation for scan-based at-speed testing

Xiaoqing Wen,, Yamashita, Y., Morishima, S., Kajihara, S., Laung-Terng Wang,, Saluja, K.K., Kinoshita, K.
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Year:
2005
Language:
english
DOI:
10.1109/TEST.2005.1584068
File:
PDF, 223 KB
english, 2005
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