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[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - On Power-profiling and Pattern Generation for Power-safe Scan Tests
Devanathan, V.R., Ravikumar, C.P., Kamakoti, V.Year:
2007
Language:
english
DOI:
10.1109/DATE.2007.364648
File:
PDF, 157 KB
english, 2007