[IEEE Design, Automation & Test in Europe Conference -...

  • Main
  • [IEEE Design, Automation & Test in...

[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - On Power-profiling and Pattern Generation for Power-safe Scan Tests

Devanathan, V.R., Ravikumar, C.P., Kamakoti, V.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2007
Language:
english
DOI:
10.1109/DATE.2007.364648
File:
PDF, 157 KB
english, 2007
Conversion to is in progress
Conversion to is failed