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Generation and recombination lifetime measurement in silicon wafers using impedance spectroscopy
Kumar, Sanjai, Singh, P K, Chilana, G S, Dhariwal, S RVolume:
24
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/24/9/095001
Date:
September, 2009
File:
PDF, 781 KB
english, 2009