[IEEE 2014 15th Latin American Test Workshop - LATW -...

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[IEEE 2014 15th Latin American Test Workshop - LATW - Fortaleza, Brazil (2014.3.12-2014.3.15)] 2014 15th Latin American Test Workshop - LATW - Analysis of the effects of single event transients on an SAR-ADC based on charge redistribution

Lanot, Alisson J. C., Balen, Tiago R.
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Year:
2014
DOI:
10.1109/LATW.2014.6841908
File:
PDF, 661 KB
2014
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