[IEEE 2007 2nd International Design and Test Workshop - Cairo, Egypt (2007.12.16-2007.12.18)] 2007 2nd International Design and Test Workshop - An Investigation on Capacitive Coupling in RAM Address Decoders
Hamdioui, Said, Al-Ars, Zaid, Gaydadjiev, Georgi N., van de Goor, Ad J.Year:
2007
Language:
english
DOI:
10.1109/IDT.2007.4437418
File:
PDF, 598 KB
english, 2007