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Radiation induced defects in SiO 2
Fitting, H.-J., Trukhin, A. N., Barfels, T., Schmidt, B., Czarnowski, A. VONVolume:
157
Language:
english
Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420150215756
Date:
January, 2002
File:
PDF, 443 KB
english, 2002