Built-in Self-Calibration and Digital-Trim Technique for...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2015 / 5 Vol. 23; Iss. 5

Built-in Self-Calibration and Digital-Trim Technique for 14-Bit SAR ADCs Achieving ±1 LSB INL

Thirunakkarasu, Shankar, Bakkaloglu, Bertan
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Volume:
23
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2014.2321761
Date:
May, 2015
File:
PDF, 4.81 MB
english, 2015
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