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Critical behavior of a random diode network
Inui, N., Kakuno, H., Tretyakov, A. Yu., Komatsu, G., Kameoka, K.Volume:
59
Language:
english
Journal:
Physical Review E
DOI:
10.1103/PhysRevE.59.6513
Date:
June, 1999
File:
PDF, 168 KB
english, 1999