Enhanced damage in linear bipolar integrated circuits at...

IEEE Transactions on Nuclear Science 1995 / Dec. Vol. 42; Iss. 6

Enhanced damage in linear bipolar integrated circuits at low dose rate

Johnston, A.H., Rax, B.G., Lee, C.I.
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Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.488762
Date:
January, 1995
File:
PDF, 1.18 MB
english, 1995
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