Far-Field Prediction Using Only Magnetic Near-Field...

IEEE Transactions on Electromagnetic Compatibility 2014 / 12 Vol. 56; Iss. 6

Far-Field Prediction Using Only Magnetic Near-Field Scanning for EMI Test

Gao, Xu, Fan, Jun, Zhang, Yaojiang, Kajbaf, Hamed, Pommerenke, David
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Volume:
56
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/TEMC.2014.2322081
Date:
December, 2014
File:
PDF, 1.04 MB
english, 2014
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