[IEEE 2009 14th IEEE European Test Symposium (ETS) -...

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[IEEE 2009 14th IEEE European Test Symposium (ETS) - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - Partial Scan Approach for Secret Information Protection

Inoue, Michiko, Yoneda, Tomokazu, Hasegawa, Muneo, Fujiwara, Hideo
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Year:
2009
Language:
english
DOI:
10.1109/ETS.2009.15
File:
PDF, 316 KB
english, 2009
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