![](/img/cover-not-exists.png)
[IEEE 2009 14th IEEE European Test Symposium (ETS) - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - Partial Scan Approach for Secret Information Protection
Inoue, Michiko, Yoneda, Tomokazu, Hasegawa, Muneo, Fujiwara, HideoYear:
2009
Language:
english
DOI:
10.1109/ETS.2009.15
File:
PDF, 316 KB
english, 2009