Exploiting diffusion currents at Ohmic contacts for trap...

Organic Electronics 2014 / 10 Vol. 15; Iss. 10

Exploiting diffusion currents at Ohmic contacts for trap characterization in organic semiconductors

Fischer, Janine, Tress, Wolfgang, Kleemann, Hans, Widmer, Johannes, Leo, Karl, Riede, Moritz
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Volume:
15
Language:
english
Journal:
Organic Electronics
DOI:
10.1016/j.orgel.2014.06.029
Date:
October, 2014
File:
PDF, 395 KB
english, 2014
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