[IEEE 2003 Instrumentation and Measurement Technology Conference (IMTC 2003) - Vail, CO, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - A baseband time domain measurement system for dynamic characterization of power amplifiers with high dynamic range over large bandwidths
Wisell, D.Volume:
2
Year:
2003
Language:
english
DOI:
10.1109/IMTC.2003.1207938
File:
PDF, 273 KB
english, 2003