[IEEE 1995 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - Rio de Janeiro, Brazil (24-27 July 1995)] Proceedings of 1995 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - A new semidistributed model for the noise and scattering parameters of the M(H)MIC FETs
Abdipour, A., Pacaud, A.Volume:
2
Year:
1995
Language:
english
DOI:
10.1109/SBMOMO.1995.511021
File:
PDF, 292 KB
english, 1995