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[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Unexpected mobility degradation for very short devices : A new challenge for CMOS scaling
Cros, Antoine, Romanjek, Krunoslav, Fleury, Dominique, Harrison, Samuel, Cerutti, Robin, Coronel, Philippe, Dumont, Benjamin, Pouydebasque, Arnaud, Wacquez, Romain, Duriez, Blandine, Gwoziecki, RomainYear:
2006
Language:
english
DOI:
10.1109/IEDM.2006.346872
File:
PDF, 346 KB
english, 2006