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Comparison of crystal orientation mapping-based and image-based measurement of grain size and grain size distribution in a thin aluminum film
Liu, Xuan, Warren, Andrew P., Nuhfer, Noel T., Rollett, Anthony D., Coffey, Kevin R., Barmak, KatayunVolume:
79
Language:
english
Journal:
Acta Materialia
DOI:
10.1016/j.actamat.2014.07.014
Date:
October, 2014
File:
PDF, 1.71 MB
english, 2014