Correlation between the nanoscale electrical and morphological properties of crystallized hafnium oxide-based metal oxide semiconductor structures
Iglesias, V., Porti, M., Nafría, M., Aymerich, X., Dudek, P., Schroeder, T., Bersuker, G.Volume:
97
Year:
2010
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.3533257
File:
PDF, 1.18 MB
english, 2010