Direct extraction of all four transistor noise parameters from 50 [ohm sign] noise figure measurements
Lázaro, A., Pradell, L., Beltrán, A., O'Callaghan, J.M.Volume:
34
Year:
1998
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19980192
File:
PDF, 441 KB
english, 1998