The effect of stress on the electrical properties of PZT thin films
Lim, Wangkyu, Ahn, Jungryul, Kim, Youngsung, Lee, Jaichan, Park, Soon Oh, Lee, Sang InVolume:
259
Language:
english
Journal:
Ferroelectrics
DOI:
10.1080/00150190108008745
Date:
January, 2001
File:
PDF, 306 KB
english, 2001