A Bit-by-Bit Re-Writable Eflash in a Generic 65 nm Logic...

IEEE Journal of Solid-State Circuits 2014 / 8 Vol. 49; Iss. 8

A Bit-by-Bit Re-Writable Eflash in a Generic 65 nm Logic Process for Moderate-Density Nonvolatile Memory Applications

Song, Seung-Hwan, Chun, Ki Chul, Kim, Chris H.
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Volume:
49
Language:
english
Journal:
IEEE Journal of Solid-State Circuits
DOI:
10.1109/JSSC.2014.2314445
Date:
August, 2014
File:
PDF, 2.87 MB
english, 2014
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