A Self-Checking Scheme to Mitigate Single Event Upset Effects in SRAM-Based FPAAs
Balen, Tiago R., Leite, Franco, Kastensmidt, Fernanda Lima, Lubaszewski, MarceloVolume:
56
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2009.2013347
Date:
August, 2009
File:
PDF, 1.47 MB
english, 2009