Spring constant calibration techniques for next-generation...

Nanotechnology 2014 / 08 Vol. 25; Iss. 33

Spring constant calibration techniques for next-generation fast-scanning atomic force microscope cantilevers

Slattery, Ashley D, Blanch, Adam J, Ejov, Vladimir, Quinton, Jamie S, Gibson, Christopher T
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Volume:
25
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/25/33/335705
Date:
August, 2014
File:
PDF, 1.15 MB
english, 2014
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