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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - A concurrent bist scheme for on-line/off-line testing based on a pre-computed test set
Voyiatzis, I., Gizopoulos, D., Paschalis, A., Halatsis, C.Year:
2005
Language:
english
DOI:
10.1109/TEST.2005.1584079
File:
PDF, 225 KB
english, 2005