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Relationship between Surface Roughness of Indium Tin Oxide and Leakage Current of Organic Light-Emitting Diode
Kim, Ki-Beom, Tak, Yoon-Heung, Han, Yoon-Soo, Baik, Kwang-Heum, Yoon, Myung-Hee, Lee, Moon-HoVolume:
42
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.42.L438
Date:
April, 2003
File:
PDF, 160 KB
english, 2003