[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - 28nm advanced CMOS resistive RAM solution as embedded non-volatile memory
Benoist, A., Blonkowski, S., Jeannot, S., Denorme, S., Damiens, J., Berger, J., Candelier, P., Vianello, E., Grampeix, H., Nodin, J. F., Jalaguier, E., Perniola, L., Allard, B.Year:
2014
Language:
english
DOI:
10.1109/IRPS.2014.6860604
File:
PDF, 1.05 MB
english, 2014