Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures
2004 Vol. 22; Iss. 6
Fluid refractive index measurements using rough surface and prism minimum deviation techniques
R. A. Synowicki, G. K. Pribil, G. Cooney, C. M. Herzinger, S. E. Green, R. H. French, M. K. Yang, J. H. Burnett, S. KaplanVolume:
22
Year:
2004
Language:
english
DOI:
10.1116/1.1813455
File:
PDF, 515 KB
english, 2004