The Use of Low Temperature Scanning Microscope for...

IEEE Transactions on Appiled Superconductivity 2009 / 06 Vol. 19; Iss. 3

The Use of Low Temperature Scanning Microscope for Estimating In-Plane Thermal Diffusivity in YBCO Thin Film

Matsekh, A., Kiss, T., Inoue, M., Yoshizumi, M., Sutoh, Y., Izumi, T., Shiohara, Y.
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Volume:
19
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/TASC.2009.2017712
Date:
June, 2009
File:
PDF, 759 KB
english, 2009
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