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Generation-recombination noise in MOSFETs
Deen, M Jamal, Levinshtein, M E, Rumyantsev, S L, Orchard-Webb, JVolume:
14
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/14/3/016
Date:
March, 1999
File:
PDF, 190 KB
english, 1999