Reliability Studies on High-Temperature Operation of Mixed...

IEEE Transactions on Device and Materials Reliability 2014 / 3 Vol. 14; Iss. 1

Reliability Studies on High-Temperature Operation of Mixed As/Sb Staggered Gap Tunnel FET Material and Devices

Yan Zhu,, Mohata, Dheeraj K., Datta, Suman, Hudait, Mantu K.
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Volume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2013.2255875
Date:
March, 2014
File:
PDF, 1.34 MB
english, 2014
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