Tunnel Field-Effect Transistors: State-of-the-Art
Lu, Hao, Seabaugh, AlanVolume:
2
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2014.2326622
Date:
July, 2014
File:
PDF, 1.62 MB
english, 2014