[IEEE 2006 IEEE International Test Conference - Santa...

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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs

Remersaro, Santiago, Lin, Xijiang, Zhang, Zhuo, Reddy, Sudhakar, Pomeranz, Irith, Rajski, Janusz
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Year:
2006
Language:
english
DOI:
10.1109/TEST.2006.297694
File:
PDF, 11.73 MB
english, 2006
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