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High-Resolution Electron Microscopy and Scanning Tunneling Microscopy of Native Oxides on Silicon
CARIM, A. H., DOVEK, M. M., QUATE, C. F., SINCLAIR, R., VORST, C.Volume:
237
Language:
english
Journal:
Science
DOI:
10.1126/science.237.4815.630
Date:
August, 1987
File:
PDF, 1.29 MB
english, 1987