Safe Operating Area and Long-Term Reliability of 9-kV...

IEEE Electron Device Letters 2014 / 8 Vol. 35; Iss. 8

Safe Operating Area and Long-Term Reliability of 9-kV Silicon Carbide PNPN Super Gate Turn-Off Thyristors

Lawson, Kevin, Bayne, Stephen B., Lacouture, Shelby, Cheng, Lin, O'Brien, Heather, Ogunniyi, Aderinto, Scozzie, Charles
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Volume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2014.2329795
Date:
August, 2014
File:
PDF, 628 KB
english, 2014
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