The influence of SiO[sub x] and SiN[sub x] passivation on...

Applied Physics Letters 2010 Vol. 96; Iss. 26

The influence of SiO[sub x] and SiN[sub x] passivation on the negative bias stability of Hf–In–Zn–O thin film transistors under illumination

Park, Joon Seok, Kim, Tae Sang, Son, Kyoung Seok, Lee, Kwang-Hee, Maeng, Wan-Joo, Kim, Hyun-Suk, Kim, Eok Su, Park, Kyung-Bae, Seon, Jong-Baek, Choi, Woong, Ryu, Myung Kwan, Lee, Sang Yoon
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Volume:
96
Year:
2010
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.3435482
File:
PDF, 525 KB
english, 2010
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