Exploring Topological Defects in Epitaxial BiFeO 3 Thin Films
Vasudevan, Rama K., Chen, Yi-Chun, Tai, Hsiang-Hua, Balke, Nina, Wu, Pingping, Bhattacharya, Saswata, Chen, L. Q., Chu, Ying-Hao, Lin, I-Nan, Kalinin, Sergei V., Nagarajan, ValanoorVolume:
5
Language:
english
Journal:
ACS Nano
DOI:
10.1021/nn102099z
Date:
February, 2011
File:
PDF, 4.97 MB
english, 2011