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[IEEE 2014 72nd Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2014.6.22-2014.6.25)] 72nd Device Research Conference - Voltage scalability of double-gate ultra-thin-body field-effect transistors with channel materials from group IV, III-V to 2D-materials based on ITRS metrics for year 2018 and beyond
Low, Kain Lu, Yeo, Yee-Chia, Liang, GengchiauYear:
2014
Language:
english
DOI:
10.1109/DRC.2014.6872368
File:
PDF, 393 KB
english, 2014