In-Situ X-ray Scattering Study of Continuous...

Journal of Physical Chemistry B 2003 / 08 Vol. 107; Iss. 31

In-Situ X-ray Scattering Study of Continuous Silica−Surfactant Self-Assembly during Steady-State Dip Coating

Doshi, Dhaval A., Gibaud, Alain, Liu, Nanguo, Sturmayr, Dietmar, Malanoski, Anthony P., Dunphy, Darren R., Chen, Hongji, Narayanan, Suresh, MacPhee, Andrew, Wang, Jin, Reed, Scott T., Hurd, Alan J., v
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Volume:
107
Language:
english
Journal:
The Journal of Physical Chemistry B
DOI:
10.1021/jp027214i
Date:
August, 2003
File:
PDF, 331 KB
english, 2003
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