High Resolution Electron Microscopy Observation of...

Japanese Journal of Applied Physics 2001 / 8 Vol. 40; Iss. Part 1, No

High Resolution Electron Microscopy Observation of Different Al-oxide Layers in Magnetic Tunnel Junctions

Yu, Andrew Chak Chung, Doole, Ron, Petford-Long, Amanda, Miyazaki, Terunobu
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Volume:
40
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.40.5058
Date:
August, 2001
File:
PDF, 1.92 MB
english, 2001
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