Depth-Profiling and Diffusion Measurements in Ice Films...

Analytical Chemistry 2000 / 11 Vol. 72; Iss. 22

Depth-Profiling and Diffusion Measurements in Ice Films Using Infrared Laser Resonant Desorption

Livingston, Frank E., Smith, Jamison A., George, Steven M.
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Volume:
72
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac000724t
Date:
November, 2000
File:
PDF, 148 KB
english, 2000
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