Advanced SiGe BiCMOS Technology for Multi-Mrad Electronic...

IEEE Transactions on Device and Materials Reliability 2014 / 9 Vol. 14; Iss. 3

Advanced SiGe BiCMOS Technology for Multi-Mrad Electronic Systems

Fleetwood, Zachary E., Kenyon, Eleazar W., Lourenco, Nelson E., Jain, Shaleen, Zhang, En Xia, England, Troy D., Cressler, John D., Schrimpf, Ronald D., Fleetwood, Daniel M.
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Volume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2014.2331980
Date:
September, 2014
File:
PDF, 1.36 MB
english, 2014
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