[IEEE 2014 72nd Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2014.6.22-2014.6.25)] 72nd Device Research Conference - Measurement and analysis of gate-induced drain leakage in short-channel strained silicon germanium-on-insulator pMOS FinFETs
Balakrishnan, Karthik, Hashemi, Pouya, Ott, John A., Leobandung, Effendi, Park, Dae-GyuYear:
2014
Language:
english
DOI:
10.1109/DRC.2014.6872383
File:
PDF, 450 KB
english, 2014