Analysis for rare earth elements in silicates by ion microprobe using doubly-charged ions
Riciputi, Lee R., Christie, W. H., Cole, David R., Rosseel, Thomas M.Volume:
65
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00057a014
Date:
May, 1993
File:
PDF, 712 KB
english, 1993