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Truly Quantitative XPS Characterization of Organic Monolayers on Silicon: Study of Alkyl and Alkoxy Monolayers on H−Si(111)
Wallart, Xavier, Henry de Villeneuve, Catherine, Allongue, PhilippeVolume:
127
Language:
english
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja0430797
Date:
June, 2005
File:
PDF, 382 KB
english, 2005