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[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Response Inversion Scan Cell (RISC): A Peak Capture Power Reduction Technique
Chen, Bo-Hua, Kao, Wei-Chung, Bai, Bing-Chuan, Shen, Shyue-Tsong, Li, James C.-M.Year:
2007
Language:
english
DOI:
10.1109/ATS.2007.74
File:
PDF, 274 KB
english, 2007