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Obtaining Charge Distributions on Geometrically Generic Nanostructures Using Scanning Force Microscopy
Jarmusik, Keith E., Eppell, Steven J., Lacks, Daniel J., Zypman, Fredy R.Volume:
27
Language:
english
Journal:
Langmuir
DOI:
10.1021/la104153p
Date:
March, 2011
File:
PDF, 890 KB
english, 2011