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[IEEE 2013 IEEE 14th International Superconductive Electronics Conference (ISEC) - Cambridge, MA, USA (2013.07.7-2013.07.11)] 2013 IEEE 14th International Superconductive Electronics Conference (ISEC) - Scanning SQUID probe microscope with STM and AFM
Miyato, Yuji, Hisayama, Kouhei, Matsui, Yasunori, Watanabe, Norimichi, Itozaki, HideoYear:
2013
Language:
english
DOI:
10.1109/ISEC.2013.6604263
File:
PDF, 1.75 MB
english, 2013