Ag-Organic Layered Samples for Optoelectronic Applications:...

Analytical Chemistry 2013 / 01 Vol. 85; Iss. 1

Ag-Organic Layered Samples for Optoelectronic Applications: Interface Width and Roughening Using a 500 eV Cs + Probe in Dynamic Secondary Ion Mass Spectrometry

Philipp, Patrick, Ngo, Quyen K., Shtein, Max, Kieffer, John, Wirtz, Tom
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Volume:
85
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac302939m
Date:
January, 2013
File:
PDF, 1.86 MB
english, 2013
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