XPS, TOF-SIMS, NEXAFS, and SPR Characterization of...

Analytical Chemistry 2008 / 04 Vol. 80; Iss. 7

XPS, TOF-SIMS, NEXAFS, and SPR Characterization of Nitrilotriacetic Acid-Terminated Self-Assembled Monolayers for Controllable Immobilization of Proteins

Cheng, Fang, Gamble, Lara J., Castner, David G.
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Volume:
80
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac702380w
Date:
April, 2008
File:
PDF, 185 KB
english, 2008
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