Formation of High-Mass Cluster Ions from Compound Semiconductors Using Time-of-Flight Secondary Ion Mass Spectrometry with Cluster Primary Ions
Goacher, Robyn E., Luo, Hong, Gardella, Joseph A.Volume:
80
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac7024656
Date:
May, 2008
File:
PDF, 388 KB
english, 2008